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  2. Scanning tunneling microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_tunneling_microscope

    A scanning tunneling microscope (STM) is a type of scanning probe microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer , then at IBM Zürich , the Nobel Prize in Physics in 1986.

  3. Scanning tunneling spectroscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_tunneling...

    Mechanism of how density of states influence V-A spectra of tunnel junction. Scanning tunneling spectroscopy is an experimental technique which uses a scanning tunneling microscope (STM) to probe the local density of electronic states (LDOS) and the band gap of surfaces and materials on surfaces at the atomic scale. [1]

  4. Scanning probe microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_probe_microscopy

    Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope , an instrument for imaging surfaces at the atomic level.

  5. Nanosurf - Wikipedia

    en.wikipedia.org/wiki/Nanosurf

    Nanosurf invented the first scanning tunneling microscope (STM) with the compact size and stability to image individual atoms on a coffee table.In its early days, Nanosurf became known for educational AFMs, and over the course of the following decades moved more and more towards providing high-end instruments for research.

  6. Spin-polarized scanning tunneling microscopy - Wikipedia

    en.wikipedia.org/wiki/Spin-polarized_scanning...

    The spin polarized scanning tunneling microscope is a versatile instrument which has gained tremendous attention due to its enhanced surface sensitivity and lateral resolution up to atomic scale, and can be used as an important tool to study ferromagnetic materials, such as dysprosium (Dy), quasi-2D thin films, nano islands and quasi-1D ...

  7. Photon scanning microscopy - Wikipedia

    en.wikipedia.org/wiki/Photon_scanning_microscopy

    PSTM can be combined with both electron scanning tunneling microscope and AFM in order to simultaneously record optical, conductive, and topological information of a sample. This experimental apparatus, published by Iwata et al., allows the characterization of semiconductors such as photovoltaics, as well as other photo-conductive materials.