Search results
Results From The WOW.Com Content Network
Simple interferometer with a beam-splitter and compensator plate. An ideal beam-splitter transmits and reflects 50% of the incident radiation. However, as any material has a limited range of optical transmittance, several beam-splitters may be used interchangeably to cover a wide spectral range.
DE – Delayed extraction; DADI – Direct analysis of daughter ions; DAPPI – Desorption atmospheric pressure photoionization; DEP – Direct exposure probe; DESI – Desorption electrospray ionization
ISO 4 (Information and documentation — Rules for the abbreviation of title words and titles of publications) is an international standard which defines a uniform system for the abbreviation of serial publication titles, i.e., titles of publications such as scientific journals that are published in regular installments.
XPS physics - the photoelectric effect.. Because the energy of an X-ray with particular wavelength is known (for Al K α X-rays, E photon = 1486.7 eV), and because the emitted electrons' kinetic energies are measured, the electron binding energy of each of the emitted electrons can be determined by using the photoelectric effect equation,
Also acid ionization constant or acidity constant. A quantitative measure of the strength of an acid in solution expressed as an equilibrium constant for a chemical dissociation reaction in the context of acid-base reactions. It is often given as its base-10 cologarithm, p K a. acid–base extraction A chemical reaction in which chemical species are separated from other acids and bases. acid ...
When a beam of high energy ions is used instead of atoms (as in secondary ion mass spectrometry), the method is known as liquid secondary ion mass spectrometry (LSIMS). [ 5 ] [ 6 ] [ 7 ] In FAB and LSIMS, the material to be analyzed is mixed with a non-volatile chemical protection environment, called a matrix , and is bombarded under vacuum ...
As the diagram on the right shows, the gallium (Ga+) primary ion beam hits the sample surface and sputters a small amount of material, which leaves the surface as either secondary ions (i+ or i−) or neutral atoms (n 0). The primary beam also produces secondary electrons (e −). As the primary beam rasters on the sample surface, the signal ...
Ion beam analysis (IBA) is an important family of modern analytical techniques involving the use of MeV ion beams to probe the composition and obtain elemental depth profiles in the near-surface layer of solids. IBA is not restricted to MeV energy ranges.