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Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM).
Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is most commonly used to identify buried junctions or defects in semiconductors, or to examine minority carrier properties.
A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused ...
Mochii is a miniature scanning electron microscope made by Seattle-based startup company Voxa. The Mochii has the same capabilities as a conventional SEM, such as usage in materials science for research purposes, microchip and semiconductor quality control, and medicine. [2] Mochii users are able to operate the microscope using an IOS app.
Charge coupled device (CCD) cameras were first applied to transmission electron microscopy in the 1980s and later became widespread. [3] [4] For use in a TEM, CCDs are typically coupled with a scintillator such as single crystal Yttrium aluminium garnet (YAG) in which electrons from the electron beam are converted to photons, which are then transferred to the sensor of the CCD via a fiber ...
The name Scanning Capacitance Microscopy was first used to describe a quality control tool for the RCA/CED (Capacitance Electronic Disc), [1] a video disk technology that was a predecessor of the DVD. It has since been adapted for use in combination with scanned probe microscopes for measuring other systems and materials with semiconductor ...
Regular Home Depot shoppers know all too well just how easy it is to walk inside the home improvement store and spend hundreds, if not thousands, of dollars during a shopping trip. ...
In April, the company acquired Amray, Inc., a Bedford, Massachusetts-based provider of scanning electron microscope (SEM) systems for applications including semiconductor manufacturing. [8] In June, the company acquired San Jose, CA-based VARS, a developer of image archiving and retrieval systems. [7]