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When the delay through the elements is greater than the clock cycle time, the elements are said to be on the critical path. The circuit will not function when the path delay exceeds the clock cycle delay so modifying the circuit to remove the timing failure (and eliminate the critical path) is an important part of the logic design engineer's task.
In static timing analysis, the word static alludes to the fact that this timing analysis is carried out in an input-independent manner, and purports to find the worst-case delay of the circuit over all possible input combinations. The computational efficiency (linear in the number of edges in the graph) of such an approach has resulted in its ...
Logic optimization is a process of finding an equivalent representation of the specified logic circuit under one or more specified constraints. This process is a part of a logic synthesis applied in digital electronics and integrated circuit design.
Interconnect capacitance is calculated by giving the extraction tool the following information: the top view layout of the design in the form of input polygons on a set of layers; a mapping to a set of devices and pins (from a Layout Versus Schematic run), and a cross sectional understanding of these layers. This information is used to create a ...
Standard Delay Format (SDF) is an IEEE standard for the representation and interpretation of timing data for use at any stage of an electronic design process. It finds wide applicability in design flows, and forms an efficient bridge between dynamic timing analysis and static timing analysis .
The method of logical effort, a term coined by Ivan Sutherland and Bob Sproull in 1991, is a straightforward technique used to estimate delay in a CMOS circuit. Used properly, it can aid in selection of gates for a given function (including the number of stages necessary) and sizing gates to achieve the minimum delay possible for a circuit.
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The group delay and phase delay properties of a linear time-invariant (LTI) system are functions of frequency, giving the time from when a frequency component of a time varying physical quantity—for example a voltage signal—appears at the LTI system input, to the time when a copy of that same frequency component—perhaps of a different physical phenomenon—appears at the LTI system output.