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  2. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    A pattern set with 100% stuck-at fault coverage consists of tests to detect every possible stuck-at fault in a circuit. 100% stuck-at fault coverage does not necessarily guarantee high quality, since faults of many other kinds often occur (e.g. bridging faults, opens faults, delay faults).

  3. False positives and false negatives - Wikipedia

    en.wikipedia.org/wiki/False_positives_and_false...

    The false positive rate (FPR) is the proportion of all negatives that still yield positive test outcomes, i.e., the conditional probability of a positive test result given an event that was not present. The false positive rate is equal to the significance level. The specificity of the test is equal to 1 minus the false positive rate.

  4. Transient recovery voltage - Wikipedia

    en.wikipedia.org/wiki/Transient_Recovery_Voltage

    Examples of TRV waveshapes. A transient recovery voltage (TRV) for high-voltage circuit breakers is the voltage that appears across the terminals after current interruption. It is a critical parameter for fault interruption by a high-voltage circuit breaker, its characteristics (amplitude, rate of rise) can lead either to a successful current interruption or to a failure (called reignition or ...

  5. Fault detection and isolation - Wikipedia

    en.wikipedia.org/wiki/Fault_detection_and_isolation

    Fault detection, isolation, and recovery (FDIR) is a subfield of control engineering which concerns itself with monitoring a system, identifying when a fault has occurred, and pinpointing the type of fault and its location. Two approaches can be distinguished: A direct pattern recognition of sensor readings that indicate a fault and an analysis ...

  6. Wafer testing - Wikipedia

    en.wikipedia.org/wiki/Wafer_testing

    Wafer testing is a step performed during semiconductor device fabrication after back end of line (BEOL) and before IC packaging.. Two types of testing are typically done. Very basic wafer parametric tests (WPT) are performed at a few locations on each wafer to ensure the wafer fabrication process has been carried out successfully.

  7. Failure rate - Wikipedia

    en.wikipedia.org/wiki/Failure_rate

    For many devices, the wear-out failure point is measured by the number of cycles performed before the device fails, and can be discovered by cycle testing. In cycle testing, a device is cycled as rapidly as practical until it fails. When a collection of these devices are tested, the test will run until 10% of the units fail dangerously. FMEDA

  8. SMPTE color bars - Wikipedia

    en.wikipedia.org/wiki/SMPTE_color_bars

    SMPTE color bars are a television test pattern used where the NTSC video standard is utilized, including countries in North America. The Society of Motion Picture and Television Engineers (SMPTE) refers to the pattern as Engineering Guideline (EG) 1-1990. [1] Its components are a known standard, and created by test pattern generators.

  9. Byzantine fault - Wikipedia

    en.wikipedia.org/wiki/Byzantine_fault

    A Byzantine fault is any fault presenting different symptoms to different observers. [2] A Byzantine failure is the loss of a system service due to a Byzantine fault in systems that require consensus among multiple components. [3] If all generals attack in coordination, the battle is won (left).