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Surface quality is characterized either by the American military standard notation (eg "60-40") or by specifying RMS (root mean square) roughness (eg "0.3 nm RMS"). [1] American notation focuses on how visible surface defects are, and is a "cosmetic" specification. RMS notation is an objective measurable property of the surface.
Surface metrology. Surface metrology is the measurement of small-scale features on surfaces, and is a branch of metrology. Surface primary form, surface fractality, and surface finish (including surface roughness) are the parameters most commonly associated with the field. It is important to many disciplines and is mostly known for the ...
Surface roughness, often shortened to roughness, is a component of surface finish (surface texture). It is quantified by the deviations in the direction of the normal vector of a real surface from its ideal form. If these deviations are large, the surface is rough; if they are small, the surface is smooth. In surface metrology, roughness is ...
Microstrip is a type of electrical transmission line which can be fabricated with any technology where a conductor is separated from a ground plane by a dielectric layer known as "substrate". Microstrip lines are used to convey microwave -frequency signals. Typical realisation technologies are printed circuit board (PCB), alumina coated with a ...
Surface finish. Surface finish, also known as surface texture or surface topography, is the nature of a surface as defined by the three characteristics of lay, surface roughness, and waviness. [1] It comprises the small, local deviations of a surface from the perfectly flat ideal (a true plane). Surface texture is one of the important factors ...
RMS in general is a statistical technique to define a representative value for a group of data points. With regard to surface roughness, it means that the heights of the individual microscopic peaks and valleys shall be averaged together via RMS to yield a measurement of roughness. See also herein f as a finish mark. RT or R/T
A profilometer is a measuring instrument used to measure a surface's profile, in order to quantify its roughness. Critical dimensions as step, curvature, flatness are computed from the surface topography. While the historical notion of a profilometer was a device similar to a phonograph that measures a surface as the surface is moved relative ...
Among these, roughness and fractality are of most importance, with roughness often indicated in terms of a rms value, and surface fractality denoted generally by D f. The effect of surface structures on thermal conductivity at interfaces is analogous to the concept of electrical contact resistance , also known as ECR , involving contact patch ...