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  2. Electromigration - Wikipedia

    en.wikipedia.org/wiki/Electromigration

    Electromigration is the transport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between conducting electrons and diffusing metal atoms. The effect is important in applications where high direct current densities are used, such as in microelectronics and related structures.

  3. Nernst–Planck equation - Wikipedia

    en.wikipedia.org/wiki/Nernst–Planck_equation

    The Nernst–Planck equation is a conservation of mass equation used to describe the motion of a charged chemical species in a fluid medium. It extends Fick's law of diffusion for the case where the diffusing particles are also moved with respect to the fluid by electrostatic forces.

  4. Electrochemical migration - Wikipedia

    en.wikipedia.org/wiki/Electrochemical_migration

    Electrochemical migration (ECM) is the dissolution and movement of metal ions in presence of electric potential, which results in the growth of dendritic structures between anode and cathode.

  5. Feedback-controlled electromigration - Wikipedia

    en.wikipedia.org/wiki/Feedback-controlled...

    Feedback-controlled electromigration (FCE) is an experimental technique to investigate the phenomenon known as electromigration. By controlling the voltage applied as the conductance varies it is possible to keep the voltage at a critical level for electromigration .

  6. Nernst equation - Wikipedia

    en.wikipedia.org/wiki/Nernst_equation

    In electrochemistry, the Nernst equation is a chemical thermodynamical relationship that permits the calculation of the reduction potential of a reaction (half-cell or full cell reaction) from the standard electrode potential, absolute temperature, the number of electrons involved in the redox reaction, and activities (often approximated by concentrations) of the chemical species undergoing ...

  7. Black's equation - Wikipedia

    en.wikipedia.org/wiki/Black's_equation

    Black's Equation is a mathematical model for the mean time to failure (MTTF) of a semiconductor circuit due to electromigration: a phenomenon of molecular rearrangement (movement) in the solid phase caused by an electromagnetic field.

  8. Failure of electronic components - Wikipedia

    en.wikipedia.org/wiki/Failure_of_electronic...

    Diffusion and electromigration tend to be accelerated by high temperatures, shortening the lifetime of the device; damage to junctions not leading to immediate failure may manifest as altered current–voltage characteristics of the junctions. Electrical overstress failures can be classified as thermally-induced, electromigration-related and ...

  9. Fundamentals of Physics - Wikipedia

    en.wikipedia.org/wiki/Fundamentals_of_Physics

    The first edition of the book to bear the title Fundamentals of Physics, first published in 1970, was revised from the original text by Farrell Edwards and John J. Merrill. [2] (Editions for sale outside the USA have the title Principles of Physics.) Walker has been the revising author since 1990. [3]