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The E-T secondary electron detector can be used in the SEM's back-scattered electron mode by either turning off the Faraday cage or by applying a negative voltage to the Faraday cage. However, better back-scattered electron images come from dedicated BSE detectors rather than from using the E–T detector as a BSE detector.
Schematic of STEM mode An ultrahigh-vacuum STEM equipped with a 3rd-order spherical aberration corrector Inside the aberration corrector (hexapole-hexapole type) A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm].
An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...
Scanning electron microscopes, on the other hand, typically look at electrons "kicked up" when one rasters a focussed electron beam across a thick specimen. Electron channeling patterns are contrast effects associated with edge-on lattice planes that show up in scanning electron microscope secondary and/or backscattered electron images.
4D scanning transmission electron microscopy (4D STEM) is a subset of scanning transmission electron microscopy (STEM) which utilizes a pixelated electron detector to capture a convergent beam electron diffraction (CBED) pattern at each scan location. This technique captures a 2 dimensional reciprocal space image associated with each scan point ...
The configuration is used in the scanning transmission electron microscope (STEM), [14] [15] and often in high-resolution X-ray ptychography. The specimen is sometimes shifted up or downstream of the probe crossover so as to allow the size of the patch of illumination to be increased, thus requiring fewer diffraction patterns to scan a wide ...
Electron channelling contrast imaging (ECCI) is a scanning electron microscope (SEM) diffraction technique used in the study of defects in materials. These can be dislocations or stacking faults that are close to the surface of the sample, low angle grain boundaries or atomic steps.
Schematic showing the concept of electron tomography. Atomic level resolution in 3D electron tomography reconstructions has been demonstrated. With the aid of computational ptychography, identification and precise 3D coordinates of every single atom [12] in tiny objects have been imaged, clearly depicting molecular structures at large and small scales.