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  2. Transistor tester - Wikipedia

    en.wikipedia.org/wiki/Transistor_tester

    The tester has all these features and can check solid-state devices in and out of circuit. Transistor h fe varies fairly widely with Ic, so measurements with the service type tester give readings that can differ quite a bit from the h fe in the transistor's real life application.

  3. Environmental stress screening - Wikipedia

    en.wikipedia.org/wiki/Environmental_stress_screening

    A component selected for testing is a Unit Under Test (UUT). Operational Safety, Suitability, and Effectiveness (OSS&E) policy and instructions require consistency in the disciplined engineering process used to ensure that activities such as maintenance repairs and part substitutions do not degrade system or end-item baselined characteristics ...

  4. Curve tracer - Wikipedia

    en.wikipedia.org/wiki/Curve_tracer

    A curve tracer is a specialised piece of electronic test equipment used to analyze the characteristics of discrete electronic components, such as diodes, transistors, thyristors, and vacuum tubes. The device contains voltage and current sources that can be used to stimulate the device under test (DUT).

  5. In-circuit testing - Wikipedia

    en.wikipedia.org/wiki/In-circuit_testing

    While in-circuit test is a very powerful tool for testing PCBs, it has these limitations: Parallel components can often only be tested as one component if the components are of the same type (i.e. two resistors); though different components in parallel may be testable using a sequence of different tests - e.g. a DC voltage measurement versus a measurement of AC injection current at a node.

  6. LCR meter - Wikipedia

    en.wikipedia.org/wiki/LCR_meter

    An LCR meter is a type of electronic test equipment used to measure the inductance (L), capacitance (C), and resistance (R) of an electronic component. [1] In the simpler versions of this instrument the impedance was measured internally and converted for display to the corresponding capacitance or inductance value. Readings should be reasonably ...

  7. Flying probe - Wikipedia

    en.wikipedia.org/wiki/Flying_probe

    A flying probe tester uses one or more test probes to make contact with the circuit board under test; the probes are moved from place to place on the circuit board to carry out tests of multiple conductors or components. Flying probe testers are a more flexible alternative to bed of nails testers, which use multiple contacts to simultaneously ...

  8. Growler (electrical device) - Wikipedia

    en.wikipedia.org/wiki/Growler_(electrical_device)

    to test series and interpoles (commutating) fields from a DC motor; to determine phasing and polarity in multiwinding armatures; to test rotors in rotating frequency changers, as well as in wound rotors; to test shorts between turns in taped coils before installation into an armature or a stator; as a low voltage isolation transformer

  9. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    ATRE allows the sharing of tester resources among DUTs using active components, which have the ability to connect and disconnect DUTs from the tester resources. Without ATRE, a single tester resource (power, DC or AC signal) would normally only go directly to one DUT.