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Transistor testers have the necessary controls and switches for making the proper voltage, current and signal settings. A meter with a calibrated "good" and "bad" scale is on the front. In addition, these transistor testers are designed to check the solid-state diodes. There are also testers for checking high transistor and rectifiers.
A rigorous test case based approach is often traditional for large software engineering projects that follow a Waterfall model. [2] However, at least one recent study did not show a dramatic difference in defect detection efficiency between exploratory testing and test case based testing. [3] Testing can be through black-, white-or grey-box ...
An LCR meter is a type of electronic test equipment used to measure the inductance (L), capacitance (C), and resistance (R) of an electronic component. [1] In the simpler versions of this instrument the impedance was measured internally and converted for display to the corresponding capacitance or inductance value. Readings should be reasonably ...
Record and playback test creation records a tester performing a manual test and allows it to be played back and maintained over and over again as an automated test. Recorded tests can be modified later by testers to create new tests or enhance existing tests with more use cases. [2]
It has been used in testing the F-14, S-3, E-2, A-7 Corsair II, A-6, etc. VAST is considered by many to be the grandfather of modern avionics test equipment. In the years that followed the cold war, ATLAS found uses on many dual-use aircraft [ clarification needed ] for the U.S. and NATO , as well as commercial business, regional, and general ...
For explosive devices, test requirements and methods are tailored from MIL-HDBK-1512 and NATO AOP-7. For batteries, guidance on test requirements is in RCC-Doc-319-99. Note: Surveillance Testing is a periodic repeat of the Acceptance Testing using trending or accelerated aging to authorize shelf life extensions.
Wafer testing is a step performed during semiconductor device fabrication after back end of line (BEOL) and before IC packaging.. Two types of testing are typically done. Very basic wafer parametric tests (WPT) are performed at a few locations on each wafer to ensure the wafer fabrication process has been carried out successfully.
to test series and interpoles (commutating) fields from a DC motor; to determine phasing and polarity in multiwinding armatures; to test rotors in rotating frequency changers, as well as in wound rotors; to test shorts between turns in taped coils before installation into an armature or a stator; as a low voltage isolation transformer