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XPS physics - the photoelectric effect.. Because the energy of an X-ray with particular wavelength is known (for Al K α X-rays, E photon = 1486.7 eV), and because the emitted electrons' kinetic energies are measured, the electron binding energy of each of the emitted electrons can be determined by using the photoelectric effect equation,
Electron spectroscopy refers to a group formed by techniques based on the analysis of the energies of emitted electrons such as photoelectrons and Auger electrons.This group includes X-ray photoelectron spectroscopy (XPS), which also known as Electron Spectroscopy for Chemical Analysis (ESCA), Electron energy loss spectroscopy (EELS), Ultraviolet photoelectron spectroscopy (UPS), and Auger ...
Extreme-ultraviolet photoelectron spectroscopy (EUPS) lies in between XPS and UPS. It is typically used to assess the valence band structure. [8] Compared to XPS, it gives better energy resolution, and compared to UPS, the ejected electrons are faster, resulting in less space charge and mitigated final state effects. [9] [10] [11]
When radiated by an X-ray beam, the sample also emits other radiations that can be used for analysis: electrons ejected by the photoelectric effect: X-ray photoelectron spectroscopy (XPS), also called electron spectroscopy for chemical analysis (ESCA)
The different electron states which exist in an atom are usually described by atomic orbital notation, as is used in chemistry and general physics. However, X-ray science has special terminology to describe the transition of electrons from upper to lower energy levels: traditional Siegbahn notation, or alternatively, simplified X-ray notation.
In about 1956, Kai Siegbahn developed X-ray photoelectron spectroscopy (XPS) for surface chemical analysis. This method uses x-ray sources to study energy levels of atomic core electrons , and at the time had an energy resolution of about 1 eV ( electronvolt ).
Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and ...
XPS may refer to: X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA) Extreme Ultraviolet Photometer System (XPS). an instrument aboard the NASA Solar Radiation and Climate Experiment (SORCE) space probe