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  2. Tesla valve - Wikipedia

    en.wikipedia.org/wiki/Tesla_valve

    (c) and (d) are zoomed-in images Schematic of a Tesla-type D-valve. A Tesla valve, called a valvular conduit by its inventor, is a fixed-geometry passive check valve. It allows a fluid to flow preferentially in one direction, without moving parts. The device is named after Nikola Tesla, who was awarded U.S. patent 1,329,559 in 1920 for its ...

  3. How to Find the Best Used Cars for Under $10,000 - AOL

    www.aol.com/news/2011-07-22-how-to-find-the-best...

    Sports Cars Winner: 2004 Mazda Miata MX-5 For a used sports car under $10,000, consider this hot little Mazda -- it moves and grooves with you. The 1.8-liter 4-cylinder engine is fun on quick ...

  4. Check valve - Wikipedia

    en.wikipedia.org/wiki/Check_valve

    Tilting-disc inconel check valve Check valve symbol on piping and instrumentation diagrams.The arrow shows the flow direction. Vertical lift check valve. A check valve, non-return valve, reflux valve, retention valve, foot valve, or one-way valve is a valve that normally allows fluid (liquid or gas) to flow through it in only one direction.

  5. Non-contact wafer testing - Wikipedia

    en.wikipedia.org/wiki/Non-contact_wafer_testing

    The wafer is lifted by the wafer prober until metal pads on one or more ICs on the wafer make physical contact with the probes. A certain amount of over-travel is required after the first probe makes contact with the wafer, for two reasons: to guarantee that all probes have made contact (to account for non-planarity of the wafer)

  6. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    Many wafers today are still tested one device at a time. If one wafer had 1000 of these devices and the time required to test one device was 10 seconds and the time for the prober to move from one device to another device was 1 second, then to test an entire wafer would take 1000 x 11 seconds = 11,000 seconds or roughly 3 hours.

  7. Wafer-scale integration - Wikipedia

    en.wikipedia.org/wiki/Wafer-scale_integration

    Wafer-scale integration (WSI) is a system of building very-large integrated circuit (commonly called a "chip") networks from an entire silicon wafer to produce a single "super-chip". Combining large size and reduced packaging, WSI was expected to lead to dramatically reduced costs for some systems, notably massively parallel supercomputers but ...

  8. Wafer testing - Wikipedia

    en.wikipedia.org/wiki/Wafer_testing

    Wafer testing is a step performed during semiconductor device fabrication after back end of line (BEOL) and before IC packaging.. Two types of testing are typically done. Very basic wafer parametric tests (WPT) are performed at a few locations on each wafer to ensure the wafer fabrication process has been carried out successfully.

  9. Double check valve - Wikipedia

    en.wikipedia.org/wiki/Double_check_valve

    A double check valve or double check assembly (DCA) is a backflow prevention device designed to protect water supplies from contamination. [1] It is different from the two-way check valves (sometimes erroneously referred to as double check valves) used in air brake systems on heavy trucks which select from the highest pressure source.

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