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2. Meat thermometer - Wikipedia

   en.wikipedia.org/wiki/Meat_thermometer

   A meat thermometer with various cooking temperatures denoted for various meat types. The probe can be inserted into the meat before starting cooking, and cooking continued until the desired internal temperature is reached. Alternatively the meat can be cooked for a certain time and taken out of the oven, and the temperature checked before serving.

3. Smoke ring (cooking) - Wikipedia

   en.wikipedia.org/wiki/Smoke_ring_(cooking)

   A smoke ring is a region of pink colored meat in the outermost 8-10 millimeters of smoked meats. [1] It is usually seen on smoked chicken, pork, and beef. There is some debate as to whether or not the presence of the smoke ring is actually an indicator of quality of the finished barbecue product but it is widely considered to be a desirable ...

4. Smoking (cooking) - Wikipedia

   en.wikipedia.org/wiki/Smoking_(cooking)

   The smoking of food likely dates back to the paleolithic era. [7] [8] As simple dwellings lacked chimneys, these structures would probably have become very smoky.It is supposed that early humans would hang meat up to dry and out of the way of pests, thus accidentally becoming aware that meat that was stored in smoky areas acquired a different flavor, and was better preserved than meat that ...

5. WokFi - Wikipedia

   en.wikipedia.org/wiki/WokFi

   WokFi (a portmanteau derived from blending the words Wok + Wi-Fi) is a slang term for a style of homemade Wi-Fi antenna consisting of a crude parabolic antenna made with a low-cost Asian kitchen wok, spider skimmer or similar household metallic dish.

6. News, Politics, Sports, Mail & Latest Headlines - AOL.com

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   Get breaking news and the latest headlines on business, entertainment, politics, world news, tech, sports, videos and much more from AOL

7. Non-contact wafer testing - Wikipedia

   en.wikipedia.org/wiki/Non-contact_wafer_testing

   Using mechanical probes has certain drawbacks: mechanical probing can damage the circuits under the probe pad on the IC [1] repeated probing can damage the probe pad on the IC, making further probing of that IC impossible; the probe card may be damaged from repeated contact, or become contaminated with debris created by contact with the wafer [2]