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CrysTBox offers tools for automated processing of diffraction patterns and high-resolution transmission electron microscope images. Since the tools employ algorithms of artificial intelligence and computer vision , they are designed to require minimal operator effort providing higher accuracy compared to manual evaluation.
Virtual Image Capture and Virtual Image Stitcher: Two software products to capture mult-field images and stitch them into one single and very large image in the fields of optical and electron microscopy (image stitching). Stereology Analyzer: Software to analyze a very large image using stereology. This extension is mainly used in the field of ...
An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...
It expanded the list of instruments supported, in particular with new Scanning electron microscope 3D reconstruction software and hyperspectral data analysis (such as Raman and FT-IR hyperspectral cube analysis). [21] Version 7.2 (February 2015) introduces near real-time 3D topography reconstruction for scanning electron microscopes
Media in category "Electron microscope images" The following 3 files are in this category, out of 3 total. Gap Junction close up.jpg 3,389 × 1,770; 1.47 MB.
Michael A. O'Keefe (born 8 September 1942, in East Melbourne, Australia) is a physicist who has worked in materials science and electron microscopy. [1] He is perhaps best known for his production of the seminal computer code for modeling of high-resolution transmission electron microscopy (HRTEM) images; [2] his software was later made available [3] as part of the DeepView package [4] for ...
Annular dark-field imaging is a method of mapping samples in a scanning transmission electron microscope (STEM). These images are formed by collecting scattered electrons with an annular dark-field detector. [1] Conventional TEM dark-field imaging uses an objective aperture to only collect scattered electrons that pass through.
Geometric phase analysis performed by CrysTBox gpaGUI showing input image (bottom left) and d-spacing map (bottom right). Geometric phase analysis is a method of digital signal processing used to determine crystallographic quantities such as d-spacing or strain from high-resolution transmission electron microscope images.