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An atomic force microscope on the left with controlling computer on the right. Atomic force microscopy [1] (AFM) is a type of SPM, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a ...
[1] [2] [3] Microscopy techniques, including Scanning Tunneling Microscope (STM), Atomic-Force Microscope (AFM) and Surface Forces Apparatus, (SFA) have been used to analyze surfaces with extremely high resolution, while indirect methods such as computational methods [4] and Quartz crystal microbalance (QCM) have also been extensively employed ...
Scheme of the colloidal probe technique for direct force measurements in the sphere-plane and sphere-sphere geometries. The colloidal probe technique is commonly used to measure interaction forces acting between colloidal particles and/or planar surfaces in air or in solution. This technique relies on the use of an atomic force microscope (AFM).
Atomic force microscope inside a FTIR spectrometer with the optical interface. The earliest measurements combining AFM with infrared spectroscopy were performed in 1999 by Hammiche et al. at the University of Lancaster in the United Kingdom, [1] in an EPSRC-funded project led by M Reading and H M Pollock.
Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...
Electrochemical AFM (EC-AFM) is a particular type of Scanning probe microscopy (SPM), which combines the classical Atomic force microscopy (AFM) together with electrochemical measurements. EC-AFM allows to perform in-situ AFM measurements in an electrochemical cell , in order to investigate the actual changes in the electrode surface morphology ...
Recently the term molecular imaging has been applied to a variety of microscopy and nanoscopy techniques including live-cell microscopy, Total Internal Reflection Fluorescence (TIRF)-microscopy, STimulated Emission Depletion (STED)-nanoscopy and Atomic Force Microscopy (AFM) as here images of molecules are the readout.
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.