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Graph and image of single-slit diffraction. As an example, an exact equation can now be derived for the intensity of the diffraction pattern as a function of angle in the case of single-slit diffraction. A mathematical representation of Huygens' principle can be used to start an equation.
Graph and image of single-slit diffraction. A long slit of infinitesimal width which is illuminated by light diffracts the light into a series of circular waves and the wavefront which emerges from the slit is a cylindrical wave of uniform intensity, in accordance with the Huygens–Fresnel principle.
Geometry of single-slit diffraction. We can find the angle at which a first minimum is obtained in the diffracted light by the following reasoning. Consider the light diffracted at an angle θ where the distance CD is equal to the wavelength of the illuminating light. The width of the slit is the distance AC.
Geometry of two slit diffraction Two slit interference using a red laser. Assume we have two long slits illuminated by a plane wave of wavelength λ. The slits are in the z = 0 plane, parallel to the y axis, separated by a distance S and are symmetrical about the origin. The width of the slits is small compared with the wavelength.
Diffraction patterns from multiple slits have envelopes determined by the single slit diffraction pattern. For a single slit the pattern is given by: [11] = () / () , where α is the diffraction angle, d is the slit width, and λ is the
Single slit diffraction intensity I 0 = source intensity; Wave phase through apertures ... N-slit diffraction (N ≥ 2) d = centre-to-centre separation of slits;
In Young's experiment, the individual slits display a diffraction pattern on top of which is overlaid interference fringes from the two slits (Fig. 2). In contrast, the Lloyd's mirror experiment does not use slits and displays two-source interference without the complications of an overlaid single-slit diffraction pattern.
Close to an aperture or atoms, often called the "sample", the electron wave would be described in terms of near field or Fresnel diffraction. [12]: Chpt 7-8 This has relevance for imaging within electron microscopes, [1]: Chpt 3 [2]: Chpt 3-4 whereas electron diffraction patterns are measured far from the sample, which is described as far-field or Fraunhofer diffraction. [12]: