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  2. Non-contact atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Non-contact_atomic_force...

    Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...

  3. Atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Atomic_force_microscopy

    The AFM can be operated in a number of modes, depending on the application. In general, possible imaging modes are divided into static (also called contact) modes and a variety of dynamic (non-contact or "tapping") modes where the cantilever is vibrated or oscillated at a given frequency. [8]

  4. Photoconductive atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Photoconductive_Atomic...

    The non-contact feedback loop is used to control that changes in the oscillations of the cantilever. [37] The application of AFM on non-conducting samples (c-AFM) has in recent years evolved into the modification used for analysis of morphologies on the local scale, particularly morphologies at heterojunctions of multilayered samples.

  5. Near-field scanning optical microscope - Wikipedia

    en.wikipedia.org/wiki/Near-field_scanning...

    Constant force feedback mode is similar to the feedback mechanism used in atomic force microscopy (AFM). Experiments can be performed in contact, intermittent contact, and non-contact modes. In shear force feedback mode, a tuning fork is mounted alongside the tip and made to oscillate at its resonance frequency.

  6. Kelvin probe force microscope - Wikipedia

    en.wikipedia.org/wiki/Kelvin_probe_force_microscope

    Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.

  7. Magnetic force microscope - Wikipedia

    en.wikipedia.org/wiki/Magnetic_force_microscope

    MFM images of 3.2 Gb and 30 Gb computer hard-drive surfaces. Comparison of Faraday-effect image (left) and MFM image (inset, lower-right) of a magnetic film. Magnetic force microscopy (MFM) is a variety of atomic force microscopy, in which a sharp magnetized tip scans a magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the ...