Search results
Results From The WOW.Com Content Network
David Vandevoorde first introduced the acronym SFINAE to describe related programming techniques. [1] Specifically, when creating a candidate set for overload resolution, some (or all) candidates of that set may be the result of instantiated templates with (potentially deduced) template arguments substituted for the corresponding template ...
Fault detection, isolation, and recovery (FDIR) is a subfield of control engineering which concerns itself with monitoring a system, identifying when a fault has occurred, and pinpointing the type of fault and its location. Two approaches can be distinguished: A direct pattern recognition of sensor readings that indicate a fault and an analysis ...
Low-density parity-check (LDPC) codes are a class of highly efficient linear block codes made from many single parity check (SPC) codes. They can provide performance very close to the channel capacity (the theoretical maximum) using an iterated soft-decision decoding approach, at linear time complexity in terms of their block length.
ECLAIR – Uses formal methods-based static code analysis techniques such as abstract interpretation and model checking combined with constraint satisfaction techniques to detect or prove the absence of certain run time errors in source code. ESC/Java and ESC/Java2 – Based on Java Modeling Language, an enriched version of Java
The impact of any latent fault tests, and The operational profile (environmental stress factors). Given a component database calibrated with field failure data that is reasonably accurate, [ 1 ] the method can predict device level failure rate per failure mode, useful life, automatic diagnostic effectiveness, and latent fault test effectiveness ...
A checksum of a message is a modular arithmetic sum of message code words of a fixed word length (e.g., byte values). The sum may be negated by means of a ones'-complement operation prior to transmission to detect unintentional all-zero messages.
The hardware fault injection method consists in real electrical signals injection into the DUT (devices under testing) in order to disturb it, supposedly well working, at hardware low level, and deceive the control - detection chain (if present) in order to see how and if the fault management strategy is implemented.
A fault model, falls under one of the following assumptions: single fault assumption: only one fault occur in a circuit. if we define k possible fault types in our fault model the circuit has n signal lines, by single fault assumption, the total number of single faults is k×n. multiple fault assumption: multiple faults may occur in a circuit.