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X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
They collect X-rays efficiently for photon energies of 0.1 to 30 keV and can achieve gains of 100 to 10000 in flux over using a pinhole at 100 mm from the X-ray source. [3] Since only X-rays entering the capillaries within a very narrow angle will be totally internally reflected, only X-rays coming from a small spot will be transmitted through ...
Digital radiography is a form of radiography that uses x-ray–sensitive plates to directly capture data during the patient examination, immediately transferring it to a computer system without the use of an intermediate cassette. [1]
Inelastically scattered X-rays have intermediate phases and so in principle are not useful for X-ray crystallography. In practice X-rays with small energy transfers are included with the diffraction spots due to elastic scattering, and X-rays with large energy transfers contribute to the background noise in the diffraction pattern.
The father-and-son scientific team of William Lawrence Bragg and William Henry Bragg, who were 1915 Nobel Prize Winners, were the original pioneers in developing X-ray emission spectroscopy. [2] An example of a spectrometer developed by William Henry Bragg , which was used by both father and son to investigate the structure of crystals, can be ...
The dominant physical process in x-ray absorption is one where the absorbed photon ejects a core photoelectron from the absorbing atom, leaving behind a core hole. [1] The ejected photoelectron's energy will be equal to that of the absorbed photon minus the binding energy of the initial core state. The atom with the core hole is now excited and ...
The analysis of the energy dependence of the emitted photons is the aim of the X-ray emission spectroscopy. [1] [2] [3] XES is also sometimes referred to as X-ray Fluorescence (XRF) spectroscopy, and while the terms can be used interchangeably, XES more often describes high energy resolution techniques [4] while XRF studies a wider energy range ...
Figure 1: Physics of X-ray fluorescence in a schematic representation. When materials are exposed to short- wavelength X-rays or to gamma rays, ionization of their component atoms may take place. Ionization consists of the ejection of one or more electrons from the atom, and may occur if the atom is exposed to radiation with an energy greater ...