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Burn-in is the process by which components of a system are exercised before being placed in service (and often, before the system being completely assembled from those components). This testing process will force certain failures to occur under supervised conditions so an understanding of load capacity of the product can be established.
The 6800's behavior when encountering HCF was known to Motorola by 1976. When the 6800 encounters the HCF instruction, the processor never finds the end of it, endlessly incrementing its program counter until the CPU is reset. [13] Hence, the address bus effectively becomes a counter, allowing the operation of all address lines to be quickly ...
Burn-in procedures are used to detect early failures. In semiconductor devices, parasitic structures, irrelevant for normal operation, become important in the context of failures; they can be both a source and protection against failure.
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time.
In computing, an eFuse (electronic fuse) is a microscopic fuse put into a computer chip.This technology was invented by IBM in 2004 [1] to allow for the dynamic real-time reprogramming of chips.
Burning a fuse bit during programming causes the bit to be read as "0" by "blowing" the fuses, which is an irreversible process. Some devices can be "reprogrammed" if the new data replaces "1"s with "0"s. Some CPU instruction sets (e.g. 6502) took advantage of this by defining a break (BRK) instruction with the operation code of '00'. In cases ...