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  2. 10 Cities Where You Can Find Cheap Used Cars - AOL

    www.aol.com/10-cities-where-cheap-used-140014341...

    Cleveland. Average used car price: $31,458 Price difference from national average (percentage): -8.1% Price difference from national average (dollar amount): -$2,769 New Car Market: Ford, Tesla ...

  3. On-board diagnostics - Wikipedia

    en.wikipedia.org/wiki/On-board_diagnostics

    The European on-board diagnostics (EOBD) regulations are the European equivalent of OBD-II, and apply to all passenger cars of category M1 (with no more than 8 passenger seats and a Gross Vehicle Weight rating of 2,500 kg, 5,500 lb or less) first registered within EU member states since January 1, 2001 for petrol-engined cars and since January ...

  4. Brake tester - Wikipedia

    en.wikipedia.org/wiki/Brake_tester

    A roller brake tester is a method of allowing the dynamic assessment of the braking system of a motor vehicle, whilst the vehicle itself is in a static condition.This type of brake tester is normally used in UK garages when used as part of an inspection lane for the MOT test.

  5. Electronic control unit - Wikipedia

    en.wikipedia.org/wiki/Electronic_control_unit

    An ECU from a Geo Storm. An electronic control unit (ECU), also known as an electronic control module (ECM), is an embedded system in automotive electronics that controls one or more of the electrical systems or subsystems in a car or other motor vehicle.

  6. MCB - Wikipedia

    en.wikipedia.org/wiki/MCB

    This page was last edited on 4 November 2024, at 00:56 (UTC).; Text is available under the Creative Commons Attribution-ShareAlike 4.0 License; additional terms may apply.

  7. Flying probe - Wikipedia

    en.wikipedia.org/wiki/Flying_probe

    One limitation in flying probe test methods is the speed at which measurements can be taken; the probes must be moved to each new test site on the board, and then a measurement must be completed. Bed-of-nails testers touch each test point simultaneously and electronic switching of instruments between test pins is more rapid than movement of probes.