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  2. X-ray photoelectron spectroscopy - Wikipedia

    en.wikipedia.org/wiki/X-ray_photoelectron...

    XPS requires high vacuum (residual gas pressure p ~ 10 −6 Pa) or ultra-high vacuum (p < 10 −7 Pa) conditions, although a current area of development is ambient-pressure XPS, in which samples are analyzed at pressures of a few tens of millibar. When laboratory X-ray sources are used, XPS easily detects all elements except hydrogen and helium.

  3. Extended X-ray absorption fine structure - Wikipedia

    en.wikipedia.org/wiki/Extended_X-ray_absorption...

    Three regions of XAS data. Extended X-ray absorption fine structure (EXAFS), along with X-ray absorption near edge structure (), is a subset of X-ray absorption spectroscopy ().

  4. Photoemission spectroscopy - Wikipedia

    en.wikipedia.org/wiki/Photoemission_spectroscopy

    Principle of angle-resolved photoemission spectroscopy. Photoemission spectroscopy ( PES ), also known as photoelectron spectroscopy , [ 1 ] refers to energy measurement of electrons emitted from solids, gases or liquids by the photoelectric effect , in order to determine the binding energies of electrons in the substance.

  5. Low-energy ion scattering - Wikipedia

    en.wikipedia.org/wiki/Low-energy_ion_scattering

    Image of a Kratos Axis-165 system equipped with XPS, ISS, and AES, from Alberta Centre for Surface Engineering and Science (ACSES). Low-energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface-sensitive analytical technique used to characterize the chemical and structural makeup of materials.

  6. X-ray spectroscopy - Wikipedia

    en.wikipedia.org/wiki/X-ray_spectroscopy

    The U.S. management did not want the laboratory to be converted to a manufacturing unit so it decided to set up a commercial unit to further develop the X-ray instrumentation market. In 1953 Norelco Electronics was established in Mount Vernon, NY, dedicated to the sale and support of X-ray instrumentation.

  7. Energy-dispersive X-ray spectroscopy - Wikipedia

    en.wikipedia.org/wiki/Energy-dispersive_X-ray...

    X-ray photoelectron spectroscopy (XPS) is another close relative of EDS, utilizing ejected electrons in a manner similar to that of AES. Information on the quantity and kinetic energy of ejected electrons is used to determine the binding energy of these now-liberated electrons, which is element-specific and allows chemical characterization of a ...

  8. X-ray fluorescence - Wikipedia

    en.wikipedia.org/wiki/X-ray_fluorescence

    In principle, the lightest element that can be analysed is beryllium (Z = 4), but due to instrumental limitations and low X-ray yields for the light elements, it is often difficult to quantify elements lighter than sodium (Z = 11), unless background corrections and very comprehensive inter-element corrections are made.

  9. X-ray emission spectroscopy - Wikipedia

    en.wikipedia.org/wiki/X-ray_emission_spectroscopy

    The first XES experiments were published by Lindh and Lundquist in 1924 [7]. Fig. 2: Energy level diagram K-lines. In these early studies, the authors utilized the electron beam of an X-ray tube to excite core electrons and obtain the -line spectra of sulfur and other elements.