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An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...
Angle-resolved photoemission spectroscopy (ARPES) is an experimental technique used in condensed matter physics to probe the allowed energies and momenta of the electrons in a material, usually a crystalline solid. It is based on the photoelectric effect, in which an incoming photon of sufficient energy ejects an electron from the surface of a ...
Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and ...
Field-emission microscopy (FEM) is an analytical technique that is used in materials science to study the surfaces of needle apexes. [1] [2] The FEM was invented by Erwin Wilhelm Müller in 1936, [3] and it was one of the first surface-analysis instruments that could approach near-atomic resolution.
The term surface enhanced Raman spectroscopy implies that it provides the same information that traditional Raman spectroscopy does, simply with a greatly enhanced signal. While the spectra of most SERS experiments are similar to the non-surface enhanced spectra, there are often differences in the number of modes present.
X-ray emission spectroscopy (XES) is a form of X-ray spectroscopy in which a core electron is excited by an incident X-ray photon and then this excited state decays by emitting an X-ray photon to fill the core hole. The energy of the emitted photon is the energy difference between the involved electronic levels.
Image Correlation Spectroscopy and its variations all were implemented on a scanning confocal or scanning two photon microscope, but transfer to other microscopes, like a spinning disk confocal microscope. Raster ICS (RICS), [52] and position sensitive FCS (PSFCS) [53] incorporate the time delay between parts of the image scan into the analysis.
Saturated absorption spectroscopy measures the transition frequency of an atom or molecule between its ground state and an excited state.In saturated absorption spectroscopy, two counter-propagating, overlapped laser beams are sent through a sample of atomic gas.