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  2. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...

  3. Electron microprobe - Wikipedia

    en.wikipedia.org/wiki/Electron_microprobe

    An electron microprobe (EMP), also known as an electron probe microanalyzer (EPMA) or electron micro probe analyzer (EMPA), is an analytical tool used to non-destructively determine the chemical composition of small volumes of solid materials. It works similarly to a scanning electron microscope: the sample is bombarded with an electron beam ...

  4. TESCAN - Wikipedia

    en.wikipedia.org/wiki/TESCAN

    The history of electron microscope production in Czechoslovakia dates back to the 1950s when a team led by Armin Delong in Brno started to produce electron microscopes. One of the first successful microscopes was the Tesla BS 242 model, which won a gold medal at the EXPO 1958. During its 30-year existence, Tesla produced over 3,000 different ...

  5. Focused ion beam - Wikipedia

    en.wikipedia.org/wiki/Focused_ion_beam

    Focused ion beam. Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM).

  6. QEMSCAN - Wikipedia

    en.wikipedia.org/wiki/QEMSCAN

    QEMSCAN is the name for an integrated automated mineralogy and petrography system providing quantitative analysis of minerals, rocks and man-made materials. QEMSCAN is an abbreviation standing for quantitative evaluation of minerals by scanning electron microscopy, and a registered trademark owned by FEI Company since 2009.

  7. Environmental scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Environmental_scanning...

    The environmental scanning electron microscope (ESEM) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs of specimens that are wet, uncoated, or both by allowing for a gaseous environment in the specimen chamber. Although there were earlier successes at viewing wet specimens in internal ...

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