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  2. Power-on self-test - Wikipedia

    en.wikipedia.org/wiki/Power-on_self-test

    A power-on self-test (POST) is a process performed by firmware or software routines immediately after a computer or other digital electronic device is powered on. [ 1 ] POST processes may set the initial state of the device from firmware and detect if any hardware components are non-functional.

  3. Built-in self-test - Wikipedia

    en.wikipedia.org/wiki/Built-in_self-test

    Programmable built-in self-test (pBIST) Memory built-in self-test (mBIST) - e.g. with the Marinescu algorithm [2] Logic built-in self-test (LBIST) Analog and mixed-signal built-in self-test (AMBIST) Continuous built-in self-test (CBIST, C-BIT) Event-driven built-in self-test, such as the BIST done to an aircraft's systems after the aircraft lands.

  4. Power-on reset - Wikipedia

    en.wikipedia.org/wiki/Power-on_reset

    On an IBM mainframe, a power-on reset (POR) is a sequence of actions that the processor performs either due to a POR request from the operator or as part of turning on power. The operator requests a POR for configuration changes that cannot be recognized by a simple System Reset .

  5. Logic built-in self-test - Wikipedia

    en.wikipedia.org/wiki/Logic_built-in_self-test

    The main advantage of LBIST is the ability to test internal circuits having no direct connections to external pins, and thus unreachable by external automated test equipment. Another advantage is the ability to trigger the LBIST of an integrated circuit while running a built-in self test or power-on self test of the finished product.

  6. PBIST - Wikipedia

    en.wikipedia.org/wiki/PBIST

    Programmable Built-In Self-Test (PBIST) is a memory DFT feature that incorporates all the required test systems into the chip itself. The test systems implemented on-chip are as follows: algorithmic address generator; algorithmic data generator; program storage unit; loop control mechanisms

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  8. Electrical outlet tester - Wikipedia

    en.wikipedia.org/wiki/Electrical_outlet_tester

    A quick supplemental screening test for these simple miswiring errors can be performed using a non-contact voltage tester (NCVT) or non-contact voltage detector. [4] If a problem is thus identified, it can be investigated further using more-advanced equipment, or the outlet in question can be de-energized and disassembled for careful scrutiny. [4]

  9. AN/SQS-26 - Wikipedia

    en.wikipedia.org/wiki/AN/SQS-26

    AN/SQS-26 was a United States Navy surface ship, bow mounted, low frequency, active/passive sonar developed by the Naval Underwater Sound Laboratory [1] and built by General Electric and the EDO Corporation. At one point, it was installed on 87 [2] US Navy warships from the 1960s to the 1990s and may still be in use on ships transferred to ...