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  2. Kelvin probe force microscope - Wikipedia

    en.wikipedia.org/wiki/Kelvin_probe_force_microscope

    Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.

  3. Infrared Nanospectroscopy (AFM-IR) - Wikipedia

    en.wikipedia.org/wiki/Infrared_Nanospectroscopy...

    AFM-IR has also been integrated with other sources including a picosecond OPO [24] offering a tuning range 1.55 μm to 16 μm (from 6450 cm −1 to 625 cm −1). In its initial development, with samples deposited on transparent prisms and using OPO laser sources, the sensitivity of AFM-IR was limited to a minimal thickness of the sample of ...

  4. Atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Atomic_force_microscopy

    The AFM has been applied to problems in a wide range of disciplines of the natural sciences, including solid-state physics, semiconductor science and technology, molecular engineering, polymer chemistry and physics, surface chemistry, molecular biology, cell biology, and medicine.

  5. Conductive atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Conductive_atomic_force...

    Topographic (left) and current (right) maps collected with CAFM on a polycrystalline HfO 2 stack. The images show very good spatial correlation. In microscopy, conductive atomic force microscopy (C-AFM) or current sensing atomic force microscopy (CS-AFM) is a mode in atomic force microscopy (AFM) that simultaneously measures the topography of a material and the electric current flow at the ...

  6. Electrostatic force microscope - Wikipedia

    en.wikipedia.org/wiki/Electrostatic_force_microscope

    A common form of electric force microscopy involves a noncontact AFM mode of operation. In this mode the cantilever is oscillated at a resonant frequency of the cantilever and the AFM tip is held such that it only senses with long range electrostatic forces without entering the repulsive contact regime.

  7. Delete (miniseries) - Wikipedia

    en.wikipedia.org/wiki/Delete_(miniseries)

    Delete is a two-episode miniseries about a reporter and a young hacker who uncovers an elusive artificial intelligence ... for Best Picture Editing and Best ...

  8. Fluidic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Fluidic_force_microscopy

    The unique characteristic of FluidFM is that it introduces microscopic channels into AFM probes. Those channels can have an aperture of less than 300 nm, or 500 times thinner than a human hair . This nanometric features enables the handling of liquid volumes at the femtoliter (fL) scale as well as force controlled manipulations of sub-micron ...

  9. Abrasive flow machining - Wikipedia

    en.wikipedia.org/wiki/Abrasive_flow_machining

    Abrasive flow machining (AFM), also known as abrasive flow deburring [1] or extrude honing, [2] is an interior surface finishing process characterized by flowing an abrasive-laden fluid through a workpiece. [1] [3] [2] This fluid is typically very viscous, having the consistency of putty, [2] [3] or dough. [1]

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