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A scanning tunneling microscope (STM) is a type of scanning probe microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer , then at IBM Zürich , the Nobel Prize in Physics in 1986.
An alternative approach for contacting nanostructures uses the tips of a multi-tip scanning tunneling microscope—in analogy to the test leads of a multimeter used at macroscale. The advantages of this approach are: (a) in situ contacting of ″as grown″ nanostructures still under vacuum helps keep delicate nanostructures free from ...
In this case, the tunneling bias voltage is the difference between the two potentials. A counter electrode is used to complete the current-carrying circuits with the working electrodes. By using these four electrodes, the electrochemical reaction is controlled precisely by the external voltage, and the surface in liquid can be observed.
Scanning tunneling spectroscopy (STS), an extension of scanning tunneling microscopy (STM), is used to provide information about the density of electrons in a sample as a function of their energy. In scanning tunneling microscopy, a metal tip is moved over a conducting sample without making physical contact.
Scanning Hall probe microscope (SHPM) is a variety of a scanning probe microscope which incorporates accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. Developed in 1996 by Oral, Bending and Henini, [2] SHPM allows mapping the magnetic induction associated with a sample.
[1] [2] [3] Microscopy techniques, including Scanning Tunneling Microscope (STM), Atomic-Force Microscope (AFM) and Surface Forces Apparatus, (SFA) have been used to analyze surfaces with extremely high resolution, while indirect methods such as computational methods [4] and Quartz crystal microbalance (QCM) have also been extensively employed.
PSTM can be combined with both electron scanning tunneling microscope and AFM in order to simultaneously record optical, conductive, and topological information of a sample. This experimental apparatus, published by Iwata et al., allows the characterization of semiconductors such as photovoltaics, as well as other photo-conductive materials.
Simultaneous experiments by Allen J. Bard using an Electrochemical Scanning Tunneling Microscope demonstrated current at large tip-to-sample distances that was inconsistent with electron tunneling. This phenomenon was attributed to Faradaic current, compelling a more thorough analysis of electrochemical microscopy. [14]