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Unified Diagnostic Services (UDS) is a diagnostic communication protocol used in electronic control units (ECUs) within automotive electronics, which is specified in the ISO 14229-1. [1] It is derived from ISO 14230-3 and the now obsolete ISO 15765-3 (Diagnostic Communication over Controller Area Network (DoCAN) [2]). 'Unified' in this context ...
UDS may refer to: Ubuntu Developer Summit, for Ubuntu Linux; Ultra Deep Survey, deepest near-infrared astronomical survey; Unified Diagnostic Services, a vehicle communication standard used for vehicle diagnostics; Union Deportiva Salamanca, a Spanish football team; Unique Development Studios, a video and computer game developer based in Sweden
Keyword Protocol 2000 (KWP2000) – a protocol for automotive diagnostic devices (runs either on a serial line or over CAN) LIN – (Local Interconnect Network) a very low cost in-vehicle sub-network; MOST – (Media Oriented Systems Transport) a high-speed multimedia interface; Multifunction Vehicle Bus – part of the Train Communication ...
Keyword Protocol 2000 (KWP2000) – a protocol for automotive diagnostic devices (runs either on a serial line or over CAN) Local Interconnect Network (LIN) – a very low cost in-vehicle sub-network Media Oriented Systems Transport (MOST) – a high-speed multimedia interface
The standards define protocols, data models, file formats and application programming interfaces for the use in the development and testing of automotive electronic control units. A large amount of popular tools in the areas of simulation, measurement, calibration and test automation are compliant to ASAM standards.
The CAN protocol was developed by Bosch for automotive and industrial control. Unlike other OBD protocols, variants are widely used outside of the automotive industry. While it did not meet the OBD-II requirements for U.S. vehicles prior to 2003, as of 2008 all vehicles sold in the US are required to implement CAN as one of their signaling ...
ecu.test automates the control of the whole test environment and supports a broad range of test tools. Various abstraction layers for measured quantities allow its application on different testing levels, e.g. within the context of model in the loop, software in the loop and hardware in the loop as well as in real systems (vehicle and driver in the loop).
The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.