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Once the ion beam has ionized target sample atoms, the sample ions are recoiled toward the detector. The beam ions are scattered at an angle that does not permit them to reach the detector. The sample ions pass through an entrance window of the detector, and depending on the type of detector used, the signal is converted into a spectrum.
An optical beam smoke detector is a device that uses a projected beam of light to detect smoke across large areas, [1] typically as an indicator of fire. [2] They are used to detect fires in buildings where standard point smoke detectors would either be uneconomical [ 3 ] or restricted for use by the height of the building.
The configuration of the ion beam apparatus can be changed and made more complex with the incorporation of additional components. The techniques for ion beam analysis are designed for specific purposes. Some techniques and ion sources are shown in table 1. Detector types and arrangements for ion beam techniques are shown in table 2.
Furthermore, the detector quantum efficiency, that is, the percentage of photons detected, varies between different detectors, with wavelength and with time, as the detector inevitably deteriorates. Two other topics that must be considered include the optics used to direct the radiation and the means of holding or containing the sample material ...
The operation of the FID is based on the detection of ions formed during combustion of organic compounds in a hydrogen flame. The generation of these ions is proportional to the concentration of organic species in the sample gas stream. To detect these ions, two electrodes are used to provide a potential difference. The positive electrode acts ...
Within the machine the transducer that detects fluorescence created from the upper beam is located a distance away from the sample and at a 90-degree angle from the incident, upper beam. The machine is constructed like this to decrease the stray light from the upper beam that may strike the detector. The optimal angle is 90 degrees.
A RHEED system requires an electron source (gun), photoluminescent detector screen and a sample with a clean surface, although modern RHEED systems have additional parts to optimize the technique. [1] [2] The electron gun generates a beam of electrons which strike the sample at a very small angle relative to the sample surface. Incident ...
Typical X-ray detectors for electron microscopes cover only a small solid angle, which makes X-ray detection relatively inefficient since X-rays are emitted from the sample in every direction. However, detectors covering large solid angles have been recently developed, [ 27 ] and atomic resolution X-ray mapping has even been achieved.
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