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XPS physics - the photoelectric effect.. Because the energy of an X-ray with particular wavelength is known (for Al K α X-rays, E photon = 1486.7 eV), and because the emitted electrons' kinetic energies are measured, the electron binding energy of each of the emitted electrons can be determined by using the photoelectric effect equation,
Extreme-ultraviolet photoelectron spectroscopy (EUPS) lies in between XPS and UPS. It is typically used to assess the valence band structure. [8] Compared to XPS, it gives better energy resolution, and compared to UPS, the ejected electrons are faster, resulting in less space charge and mitigated final state effects. [9] [10] [11]
A surface core level shift (SCS) is a kind of core-level shift that often emerges in X-ray photoelectron spectroscopy spectra of surface atoms.. Because surface atoms have different chemical environments from bulk atoms, small shifts of binding energies are observed by X-ray photoelectron spectroscopy.
Electron spectroscopy refers to a group formed by techniques based on the analysis of the energies of emitted electrons such as photoelectrons and Auger electrons.This group includes X-ray photoelectron spectroscopy (XPS), which also known as Electron Spectroscopy for Chemical Analysis (ESCA), Electron energy loss spectroscopy (EELS), Ultraviolet photoelectron spectroscopy (UPS), and Auger ...
Modern analyzers have slits as narrow as 0.05 mm. The energy–angle–angle maps are usually further processed to give energy–k x –k y maps, and sliced in such a way to display constant energy surfaces in the band structure and, most importantly, the Fermi surface map when they are cut near the Fermi level.
Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and ...
An example of this determination is given by Park et al. [9] Briefly, the full width of the photoelectron spectrum (from the highest kinetic energy/lowest binding energy point to the low kinetic energy cutoff) is measured and subtracted from the photon energy of the exciting radiation, and the difference is the work function. Often, the sample ...
Image of a Kratos Axis-165 system equipped with XPS, ISS, and AES, from Alberta Centre for Surface Engineering and Science (ACSES). Low-energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface-sensitive analytical technique used to characterize the chemical and structural makeup of materials.