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  2. Profilometer - Wikipedia

    en.wikipedia.org/wiki/Profilometer

    An optical profilometer is a non-contact method for providing much of the same information as a stylus based profilometer. There are many different techniques which are currently being employed, such as laser triangulation ( triangulation sensor ), confocal microscopy (used for profiling very small objects), coherence scanning interferometry ...

  3. ISO 16610 - Wikipedia

    en.wikipedia.org/wiki/ISO_16610

    Areal filters are defined for surfaces measured either by lateral scanning instruments or optical profilometers. Parts related to areal filters are: ISO 16610-60: Linear areal filter: Basic concepts (published in 2015) ISO 16610-61: Linear areal filter: Gaussian filters (published in 2015) ISO 16610-62: Linear areal filter: Spline filters

  4. Veeco - Wikipedia

    en.wikipedia.org/wiki/Veeco

    Veeco Instruments Inc. is a global capital equipment supplier, headquartered in the U.S., that designs and builds processing systems used in semiconductor and compound semiconductor manufacturing, data storage and scientific markets for applications such as advanced packaging, photonics, power electronics and display technologies.

  5. Korean Photonics Technology Institute (KOPTI) Purchases Veeco ...

    www.aol.com/news/2013-01-15-korean-photonics...

    Veeco does not undertake any obligation to update any forward-looking statements to reflect future events or circumstances after the date of such statements. Veeco Instruments Inc. Debra Wasser ...

  6. NANEO Precision IBS Coatings GmbH Expands Manufacturing ... - AOL

    www.aol.com/news/2013-02-15-naneo-precision-ibs...

    NANEO Precision IBS Coatings GmbH Expands Manufacturing Capacity with Veeco IBD System PLAINVIEW, N.Y.--(BUSINESS WIRE)-- Veeco Instruments Inc. (NAS: VECO) announced today that NANEO Precision ...

  7. White light scanner - Wikipedia

    en.wikipedia.org/wiki/White_light_scanner

    Figure 3. White light interferometric microscope. White-light interferometry scanning (WLS) systems capture intensity data at a series of positions along the vertical axis, determining where the surface is located by using the shape of the white-light interferogram, the localized phase of the interferogram, or a combination of both shape and phase.

  8. Surface metrology - Wikipedia

    en.wikipedia.org/wiki/Surface_metrology

    Another disadvantage is that profilometers have difficulty detecting flaws of the same general size as the roughness of the surface. [1] There are also limitations for non-contact instruments. For example, instruments that rely on optical interference cannot resolve features that are less than some fraction of the operating wavelength.

  9. Optical comparator - Wikipedia

    en.wikipedia.org/wiki/Optical_comparator

    An optical comparator (often called just a comparator in context) or profile projector is a device that applies the principles of optics to the inspection of manufactured parts. In a comparator, the magnified silhouette of a part is projected upon the screen, and the dimensions and geometry of the part are measured against prescribed limits .