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Figure 1: Schematic layout of a White-light Interferometer. A CCD image sensor like those used for digital photography is placed at the point where the two images are superimposed. A broadband “white light” source is used to illuminate the test and reference surfaces. A condenser lens collimates the light from the broadband light source.
A white light scanner (WLS) is a device for performing surface height measurements of an object using coherence scanning interferometry with spectrally-broadband, "white light" illumination. Different configurations of scanning interferometer may be used to measure macroscopic objects with surface profiles measuring in the centimeter range, to ...
The result is that light traveling an equal optical path length in the test and reference beams produces a white light fringe of constructive interference. [ 24 ] [ 25 ] The heart of the Fabry–Pérot interferometer is a pair of partially silvered glass optical flats spaced several millimeters to centimeters apart with the silvered surfaces ...
Diffraction-grating interferometer (white light) Double-slit interferometer; Dual-polarization interferometry; Fabry–Pérot interferometer; Fizeau interferometer; Fourier-transform interferometer; Fresnel interferometer (e.g. Fresnel biprism, Fresnel mirror or Lloyd's mirror) Fringes of Equal Chromatic Order interferometer (FECO) Gabor hologram
Michelson interferometers using a white light source White light has a tiny coherence length and is difficult to use in a Michelson (or Mach–Zehnder ) interferometer. Even a narrowband (or "quasi-monochromatic") spectral source requires careful attention to issues of chromatic dispersion when used to illuminate an interferometer.
Optical coherence tomogram of a fingertip. It is possible to observe the sweat glands, having "corkscrew appearance" Interferometric reflectometry of biological tissue, especially of the human eye using short-coherence-length light (also referred to as partially-coherent, low-coherence, or broadband, broad-spectrum, or white light) was investigated in parallel by multiple groups worldwide ...
The technique encompasses but is not limited to instruments that use spectrally broadband, visible sources (white light) to achieve interference fringe localization. CSI uses either fringe localization alone or in combination with interference fringe phase, depending on the surface type, desired surface topography repeatability and software ...
White light interferometry is commonly used for detecting deformations of the wafer surface based on optical measurements. Low-coherence light from a white light source passes through the optical top wafer, e.g. glass wafer, to the bond interface.