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Bugs, or defects, can include issues like missing features (comparing the layout to the specification), errors in design (typo and functional errors), etc. When the coverage reaches a maximum percentage then the verification team will sign it off. By using a methodology like UVM, OVM, or VMM, the verification team develops a reusable environment.
Today, VCS provides comprehensive support for all functional verification methodologies and languages (including VHDL, Verilog, SystemVerilog, Verilog AMS, SystemC, and C/C++), and advanced simulation technologies including native low power, x-propagation, unreachability analysis, and fine-grained parallelism.
The Universal Verification Methodology (UVM) is a standardized methodology for verifying integrated circuit designs. UVM is derived mainly from OVM (Open Verification Methodology) which was, to a large part, based on the eRM (e Reuse Methodology) for the e verification language developed by Verisity Design in 2001.
Electronic system level (ESL) design and verification is an electronic design methodology, focused on higher abstraction level concerns. The term Electronic System Level or ESL Design was first defined by Gartner Dataquest , an EDA-industry-analysis firm, on February 1, 2001. [ 1 ]
Fast PVT—verify against process, voltage, and temperature corners; Fast Monte Carlo—verification against 3-sigma process (statistical) variation; High-Sigma Monte Carlo—verification against high-sigma process (statistical) variation; Cell Optimizer—automated sizing of custom ICs; Through Austemper Design Systems Acquisition
Physical verification is a process whereby an integrated circuit layout (IC layout) design is verified via EDA software tools to ensure correct electrical and logical functionality and manufacturability. Verification involves design rule check (DRC), layout versus schematic (LVS), XOR (exclusive OR), antenna checks and electrical rule check ...
The Open Verification Methodology (OVM) is a documented methodology with a supporting building-block library for the verification of semiconductor chip designs. The initial version, OVM 1.0, was released in January, 2008, [ 1 ] and regular updates have expanded its functionality.
The process of functional verification requires to raise the level of abstraction of any Design Under Test (DUT) beyond the RTL level. This necessity calls for a language that is capable of encapsulating data and models, which is readily available in object-oriented languages.